Conference Publication Details Mandatory Fields Authors Kelleher D., Temko A., O’Regan S., Nash D., McNamara B., Costello D., Marnane W.P., Conference Title 33rd Annual International IEEE EMBS Conference Title of Paper Parallel Artefact Rejection for Epileptiform Activity Detection in Routine EEG Year 2011 Month September Status Published Peer Reviewed 1 Times Cited () Optional Fields Keywords Editors Start Page 7953 End Page 7956 Location Boston, MA, USA. Start Date 30-AUG-11 End Date 03-SEP-11 Abstract The EEG signal is very often contaminated by electrical activity external to the brain. These artefacts make the accurate detection of epileptiform activity more difficult. A scheme developed to improve the detection of these artefacts (and hence epileptiform event detection) is introduced. A structure of parallel Support Vector Machine classifiers is assembled, one classifier tuned to perform the identification of epileptiform activity, the remainder trained for the detection of ocular and movement-related artefacts. This strategy enables an absolute reduction in false detection rate of 21.6% with the constraint of ensuring all epileptic events are recognized. Such a scheme is desirable given that sections of data which are heavily contaminated with artefact need not be excluded from analysis. Funded By URL http://embc2011.embs.org/ DOI Link 10.1109/IEMBS.2011.6091961 Grant Details Funding Body Science Foundation Ireland Grant Details Science Foundation Ireland SFI/07/SRC/I1169 and SFI/10/IN.1/B3036.