Conference Publication Details
Mandatory Fields
Kelleher D., Temko A., O’Regan S., Nash D., McNamara B., Costello D., Marnane W.P.,
33rd Annual International IEEE EMBS Conference
Parallel Artefact Rejection for Epileptiform Activity Detection in Routine EEG
2011
September
Published
1
()
Optional Fields
7953
7956
Boston, MA, USA.
30-AUG-11
03-SEP-11
The EEG signal is very often contaminated by electrical activity external to the brain. These artefacts make the accurate detection of epileptiform activity more difficult. A scheme developed to improve the detection of these artefacts (and hence epileptiform event detection) is introduced. A structure of parallel Support Vector Machine classifiers is assembled, one classifier tuned to perform the identification of epileptiform activity, the remainder trained for the detection of ocular and movement-related artefacts. This strategy enables an absolute reduction in false detection rate of 21.6% with the constraint of ensuring all epileptic events are recognized. Such a scheme is desirable given that sections of data which are heavily contaminated with artefact need not be excluded from analysis.
http://embc2011.embs.org/
10.1109/IEMBS.2011.6091961
Grant Details
Science Foundation Ireland
Science Foundation Ireland SFI/07/SRC/I1169 and SFI/10/IN.1/B3036.