Peer-Reviewed Journal Details
Mandatory Fields
Long, RD,Shin, B,Monaghan, S,Cherkaoui, K,Cagnon, J,Stemmer, S,McIntyre, PC,Hurley, PK
2012
January
Journal of the Electrochemical Society
Erratum: Charged Defect Quantification in Pt/Al2O3/In0.53Ga0.47As/InP MOS Capacitors (vol 158, pg G103, 2011)
Published
()
Optional Fields
159
17
17
Erratum for vol 158, pg G104, 2011: Equation 6 should be

VfbN −VfbP = WmsN − Qfixed/Cox−WmsP + Qfixed/Cox + qDit/Cox = 0.668+ qDit/Cox                                                 [6].
DOI 10.1149/2.119206jes
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