Rasappa, S.; Borah, D.; Senthamaraikannan, R.; Faulkner, C. C.; Shaw, M. T.; Gleeson, P.; Holmes, J. D.; Morris, M. A.

2012

November

Thin Solid Films

Block copolymer lithography: feature size control and extension by an over-etch technique

Published

()

522

318

323

Block copolymer lithography based on block copolymer (BCP) self-assembly can be used to develop soft mask nanoscale templates for subsequent pattern transfer to generate substrate features. Self-assembly of lamellar polystyrene-b-polymethylmethacrylate BCP of varying molecular weights to generate silicon nanoscale features is reported here. It has also been demonstrated that the feature size can be controlled by a plasma over-etch process and discussed

http://www.journals.elsevier.com/thin-solid-films/