Conference Contribution Details
Mandatory Fields
Naresh Kumar Gunasekar, Ben Hourahine, Paul R Edwards, Jochen Bruckbauer, Robert W Martin, Christof Mauder, Austin Day, Aimo Winkelmann, Peter Parbrook, Angus J Wilkinson, Carol Trager Cowan
7th International Workshop on Nitride Semiconductors
Applications of electron channelling contrast imaging for characterizing nitride semiconductor thin films in a scanning electron microscope
Sapporo, Japan
Oral Presentation
2012
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0
Optional Fields
14-OCT-12
19-OCT-12
EPSRC, SFI, EU FP7