Peer-Reviewed Journal Details
Mandatory Fields
Long, R.D. and Shin, B. and Monaghan, S. and Cherkaoui, K. and Cagnon, J. and Stemmer, S. and McIntyre, P.C. and Hurley, P.K.
2012
Journal of the Electrochemical Society
Erratum: Charged defect quantification in PtAl 2O 3In 0.53Ga 0.47AsInP MOS capacitors (Journal of the Electrochemical Society (2011) 158 (G103))
Validated
()
Optional Fields
159
6
S17
http://www.scopus.com/inward/record.url?eid=2-s2.0-84861363051&partnerID=40&md5=f657775f7a84f57d1f851744815beec8
10.1149/2.119206jes
Grant Details