Gomeniuk, Y.Y. and Gomeniuk, Y.V. and Tyagulskii, I.P. and Tyagulskii, S.I. and Nazarov, A.N. and Lysenko, V.S. and Cherkaoui, K. and Monaghan, S. and Hurley, P.K.

2011

Microelectronic Engineering

Transport and interface states in high-κ LaSiO x dielectric

Validated

()

88

7

1342

1345

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