Miranda, E. and O'Connor, E. and Hughes, G. and Casey, P. and Cherkaoui, K. and Monaghan, S. and Long, R. and O'Connell, D. and Hurley, P.K.

2009

Microelectronic Engineering

Degradation dynamics and breakdown of MgO gate oxides

Validated

()

86

7-9

1715

1717

http://www.scopus.com/inward/record.url?eid=2-s2.0-67349273025&partnerID=40&md5=54255efe4c3faa00c4509488b4f69140