Lu, Y. and Hall, S. and Tan, L.Z. and Mitrovic, I.Z. and Davey, W.M. and Raeissi, B. and Engström, O. and Cherkaoui, K. and Monaghan, S. and Hurley, P.K. and Gottlob, H.D.B. and Lemme, M.C.

2009

Leakage current effects on C-V plots of high- k metal-oxide-semiconductor capacitors

Validated

()

27

1

352

355

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