Pilling, M. J.,Gardner, P.,Kausar, R.,Pemble, M. E.,Surman, M.

1999

August

Surface Science

A far-infrared RAIRS investigation of SnCl4 and water on thin-film carbon and silica surfaces

Validated

()

433

22

2622

Far-infrared RAIRS spectroscopy employing synchrotron radiation as a soul ee, has been used to study the interaction of SnCl4, and water on thin-him silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. (C) 1999 Elsevier Science B.V. All rights reserved.Far-infrared RAIRS spectroscopy employing synchrotron radiation as a soul ee, has been used to study the interaction of SnCl4, and water on thin-him silica and carbon surfaces. This has been made possible by growing the thin films on a highly reflecting tungsten substrate, enabling the conventional RAIRS geometry to be used. In addition to the observation of a strongly chemisorbed species on the silica surface the spectra from both surfaces indicate the presence of a more weakly bound complex containing both water and SnCl4. (C) 1999 Elsevier Science B.V. All rights reserved.

0039-60280039-6028

://WOS:000082235500005://WOS:000082235500005