Conference Publication Details
Mandatory Fields
Hill, M.,O'Mahony, C.,Hughes, PJ,Lane, B.,Mathewson, A.
IEEE International Conference on Microelectronic Test StructuresIEEE International Conference on Microelectronic Test Structures
Test structures for a MEMS SiOx/metal processTest structures for a MEMS SiOx/metal process
2002
April
Validated
()
Optional Fields
203
210203
Cork, IrelandCork, Ireland
Grant Details