Conference Contribution Details
Mandatory Fields
G Naresh-Kumar, B Hourahine, P R Edwards, J Brickbauer, R W Martin, C Mauder, A P Day, A Winkelmann, P J Parbrook, A J Wilkinson, C Trager-Cowan
UK Semiconductors 2012
Applications of electron channelling contrast imaging for characterising nitride semiconductor thin films in an scanning electron microscope
Sheffield
Poster Presentation
2012
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0
Optional Fields
04-JUL-12
05-JUL-12
EPSRC (UK), SFI