Book Chapter Details
Mandatory Fields
O. Engstrom, I.Z. Mitrovic, S. Hall, P.K. Hurley, K. Cherkaoui, S. Monaghan, H.D.B. Gottlob, M.C. Lemme
2010
Nanoscale CMOS Innovative Materials, Modeling and Characterization
Gate Stacks
John Wiley & Sons, Inc.
111 River Street, Hoboken, NJ, USA
Published
0
Optional Fields
ISBN 978-1-84821-180-3
Grant Details