Peer-Reviewed Journal Details
Mandatory Fields
Chen, Wenbin,McCarthy, Kevin G.,Mathewson, Alan,Copuroglu, Mehmet,O'Brien, Shane,Winfield, Richard
2012
June
IEEE Transactions On Electron Devices
Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers
Validated
()
Optional Fields
59
66
1723
17291723
0018-93830018-9383
://WOS:000304243600022://WOS:000304243600022
Grant Details