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Mandatory Fields
Modreanu, M. and Nolan, M. and Elliott, S. D. and Durand, O. and Servet, B. and Garry, G. and Gehan, H. and Huyberechts, G. and Papadopoulou, E. L. and Androulidaki, M. and Aperathitis, E.
Thin Solid Films
Optical and microstructural properties of p-type SrCu(2)O(2): First principles modeling and experimental studies
Optional Fields
In this paper, we report first principles calculations and experimental studies of the optical and microstructural properties of both bulk and thin films of SrCu(2)O(2). Polycrystalline SrCu(2)O(2) films were grown by a conventional Pulsed Laser Deposition method in a flowing oxygen environment on coming glass 7059 and silicon substrates. Several characterization techniques, including X-ray diffraction (XRD), Fourier Transform IR (FTIR), Raman, spectroscopic ellipsometry, reflectance/transmission spectrophotometry and Atomic Force Microscopy have been used for the investigation of the microstructural and vibrational properties of both bulk and thin films of SrCu(2)O(2). XRD shows that bulk SrCu(2)O(2) is polycrystalline and assumes the pure tetragonal phase of SrCuO(2). The vibrational properties of the tetragonal phase of SrCu(2)O(2) have been inferred from Raman and FTIR spectroscopies and for the first time both Raman and IR active modes have been assigned. The bulk polycrystalline SrCu(2)O(2) optical band gap determined from spectroscopic ellipsometry was 3.34 +/- 0.01 eV XRD results confirmed that pure non-textured polycrystalline phase SrCu(2)O(2) thin films with a smooth surface can be grown by PLD at low temperature (300 degrees C). (c) 2007 Elsevier B.V. All rights reserved.
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