Peer-Reviewed Journal Details
Mandatory Fields
Sheikh, Mumtaz,Riza, Nabeel A.
2009
June
IEEE Photonics Technology Letters
Demonstration of Pinhole Laser Beam Profiling Using a Digital Micromirror Device
Validated
()
Optional Fields
21
9-129-12
666
668666
Demonstrated for the first time, to the best of the authors' knowledge, is two-dimensional (2-D) pinhole laser beam profiling using a Texas Instruments visible band digital micromirror device (DMD). Software controlled micromirror digital tilt positions across the DMD plane create a moving pinhole for sampling an arbitrary distribution laser beam power profile. A 532-nm 0.5-W laser coupled to an optically addressed nematic liquid crystal spatial light modulator is used to generate a laser beam black-and-white high-resolution test line pattern having a 62.5-mu m linewidth. The test pattern is successfully profiled using a DMD formed 27.36 mu m x 27.36 mu m pinhole. Demonstrated for the first time is 2-D knife-edge DMD-based profiling of an ultraviolet 337-nm 4-ns pulsewidth 10-Hz pulsed laser beam.Demonstrated for the first time, to the best of the authors' knowledge, is two-dimensional (2-D) pinhole laser beam profiling using a Texas Instruments visible band digital micromirror device (DMD). Software controlled micromirror digital tilt positions across the DMD plane create a moving pinhole for sampling an arbitrary distribution laser beam power profile. A 532-nm 0.5-W laser coupled to an optically addressed nematic liquid crystal spatial light modulator is used to generate a laser beam black-and-white high-resolution test line pattern having a 62.5-mu m linewidth. The test pattern is successfully profiled using a DMD formed 27.36 mu m x 27.36 mu m pinhole. Demonstrated for the first time is 2-D knife-edge DMD-based profiling of an ultraviolet 337-nm 4-ns pulsewidth 10-Hz pulsed laser beam.
1041-11351041-1135
://WOS:000267064600037://WOS:000267064600037
Grant Details