Turner, AR and Pemble, ME and Fernandez, JM and Joyce, BA and Zhang, J and Taylor, AG

1995

January

Physical review letters

Real Time Observation of Reflectance Anisotropy and Reflection High-Energy Electron Diffraction Intensity Oscillations During Gas-Source Molecular-Beam-Epitaxy Growth of Si and SiGe on Si (001)

Validated

74

16

3213