Zhang, J and Lees, AK and Taylor, AG and Raisbeck, D and Shukla, N and Fernandez, JM and Joyce, BA and Pemble, ME

1996

January

Journal of Crystal growth

In-situ monitoring of Si and SiGe growth on Si (001) surfaces during gas-source molecular beam epitaxy using reflectance anisotropy

Validated

164

1

40

46