Djara, V and Cherkaoui, K and Schmidt, M and Gomeniuk, YY and O'Connor, E and Povey, IM and O'Connell, D and Monaghan, S and Pemble, ME and Hurley, PK

Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on

Study of interface and oxide defects in high-k/In 0.53 Ga 0.47 As n-MOSFETs

2012

January

Validated

()

29

32