Peer-Reviewed Journal Details
Mandatory Fields
Djara, V and O’Regan, TP and Cherkaoui, K and Schmidt, M and Monaghan, S and O’Connor, \'E and Povey, IM and O’Connell, D and Pemble, ME and Hurley, PK
2013
January
Electrically active interface defects in the In< sub> 0.53 Ga< sub> 0.47 As MOS system
Validated
()
Optional Fields
109
182
188
Grant Details