Brennan, B. and Galatage, R. V. and Thomas, K. and Pelucchi, E. and Hurley, P. K. and Kim, J. and Hinkle, C. L. and Vogel, E. M. and Wallace, R. M.

2013

September

Journal of Applied Physics

Chemical and electrical characterization of the HfO2/InAlAs interface

Validated

WOS: 19 ()

114

10

104103

10.1063/1.4821021