Peer-Reviewed Journal Details
Mandatory Fields
Duffy, R., Heringa, A., Venezia, V.C., Loo, J., Verheijen, M.A., Hopstaken, M.J.P., van der Tak, K., de Potter, M., Hooker, J.C., Meunier-Beillard, P., Delhougne, R.
2010
January
Quantitative prediction of junction leakage in bulk-technology CMOS devices
Validated
()
Optional Fields
54
3
243
251
http://www.scopus.com/inward/record.url?eid=2-s2.0-76449097106&partnerID=40&md5=54490b11b018b2e86d711d25f7de320b
Grant Details