Peer-Reviewed Journal Details
Mandatory Fields
Cristiano, F., Bazizi, E.M., Fazzini, P.F., Boninelli, S., Duffy, R., Pakfar, A., Paul, S., Lerch, W.
2008
January
Extended defects evolution in pre-amorphlsed silicon after millisecond flash anneals
Validated
()
Optional Fields
573-574
269
277
http://www.scopus.com/inward/record.url?eid=2-s2.0-45749114988&partnerID=40&md5=08ba932db589f504a6cc8d6e83020746
Grant Details