Conference Publication Details
Mandatory Fields
O┐Sullivan, J.A., Chen, W., McCarthy, K.G., Crean, G.M;
IEEE International Conference on Microelectronic Test Structures
┐Advanced Test Structure Design for Dielectric Characterization of High-K Material┐
2008
March
Validated
1
()
Optional Fields
180
184
24-FEB-07
25-FEB-07
Grant Details