Mandatory Fields

Authors

O¿Sullivan, J.A., Chen, W., McCarthy, K.G., Crean, G.M;

Conference Title

IEEE International Conference on Microelectronic Test Structures

Title of Paper

¿Advanced Test Structure Design for Dielectric Characterization of High-K Material¿

Year

2008

Month

March

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

180

End Page

184

Location

Start Date

24-FEB-07

End Date

25-FEB-07

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details