Peer-Reviewed Journal Details
Mandatory Fields
O'Mahony, Donagh and Duane, Russell and Campagno, Tony and Lewis, Liam and Cordero, Nicolas and Maaskant, Pleun and Waldron, Finbarr and Corbett, Brian
2011
January
Microelectronics Reliability
Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000\'ah at 350\'aŽ C
Validated
()
Optional Fields
Grant Details