O'Mahony, Donagh and Duane, Russell and Campagno, Tony and Lewis, Liam and Cordero, Nicolas and Maaskant, Pleun and Waldron, Finbarr and Corbett, Brian

2011

January

Microelectronics Reliability

Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000\'ah at 350\'a¦ C

Validated

()