Peer-Reviewed Journal Details
Mandatory Fields
Houlihan, JA and Voignier, V and O Callaghan, JR and Wu, G and Huyet, G and McInerney, JG and Corbett, B
2002
January
Improved beam quality due to current profiling in a broad-area semiconductor laser [4947-31]
Validated
()
Optional Fields
261
269
Grant Details