Peer-Reviewed Journal Details
Mandatory Fields
Trager-Cowan, C and Naresh-Kumar, G and Allehiani, N and Kraeusel, S and Hourahine, B and Vespucci, S and Thomson, D and Bruckbauer, J and Kusch, G and Edwards, PR and others
2014
Unknown
Microscopy and Microanalysis
Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
Validated
()
Optional Fields
20
3
Grant Details
Science Foundation Ireland