Peer-Reviewed Journal Details
Mandatory Fields
Fang, Q.,Liaw, I.,Modreanu, M.,Hurley, P. K.,Boyd, I. W.
2005
June
Microelectronics Reliabilitymicroelectronics Reliability
Post deposition UV-induced O(2) annealing of HfO(2) thin films
Validated
()
Optional Fields
45
5-65-6
957
960
0026-27140026-2714
://WOS:000227914200046://WOS:000227914200046
Grant Details