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Authors

Power, JA and Mathewson, A and Lane, WA

Conference Title

Microelectronic Test Structures, 1993. ICMTS 1993. Proceedings of the 1993 International Conference on

Title of Paper

An approach for relating model parameter variabilities to process fluctuations

Year

1993

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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Abstract

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