More Journal Details

Mandatory Fields

Authors

Martin, A and O'Sullivan, P and Mathewson, A

Year

1997

Month

January

Journal

Microelectronics Reliability

Title

Study of unipolar pulsed ramp and combined ramped/constant voltage stress on mos gate oxides

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

37

Issue

7

Start Page

1045

End Page

1051

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details