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Mandatory Fields

Authors

Foley, Sean and Floyd, Liam and Mathewson, Alan

Year

2000

Month

January

Journal

Microelectronics Reliability

Title

A novel fast technique for detecting voiding damage in IC interconnects

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

40

Issue

1

Start Page

87

End Page

97

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

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Grant Details