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Mandatory Fields

Authors

Hurley, Paul K and Sheehan, Eoin and Moran, Stephen and Mathewson, Alan

Year

1996

Month

January

Journal

Microelectronics Reliability

Title

The impact of oxide degradation on the low frequency (1f) noise behaviour of P channel mosfets

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

36

Issue

11

Start Page

1679

End Page

1682

Abstract

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Publisher

ISBN / ISSN

Edition

URL

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