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Mandatory Fields

Authors

Foley, Sean and Ryan, Anne and Martin, David and Mathewson, Alan

Year

1998

Month

January

Journal

Microelectronics Reliability

Title

A study of the influence of inter-metal dielectrics on electromigration performance

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

38

Issue

1

Start Page

107

End Page

113

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

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