Mandatory Fields

Authors

Martin, Andreas and Suehle, John and Chaparala, Prasad and O'Sullivan, Paula and Mathewson, Alan and Messick, C

Conference Title

Integrated Reliability Workshop, 1995. Final Report., International

Title of Paper

Assessing MOS gate oxide reliability on wafer level with ramped/constant voltage and current stress

Year

1995

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

End Page

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details