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Authors

Martin, Andreas and O'Sullivan, Paula and Mathewson, Alan

Year

1996

Month

January

Journal

Microelectronics journal

Title

Correlation of SiO< sub> 2 lifetimes from constant and ramped voltage measurements

Status

Validated

Peer Reviewed

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Keywords

Volume

27

Issue

7

Start Page

633

End Page

645

Abstract

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Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

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