Conference Publication Details

Mandatory Fields

Authors

Minehane, Sean and O'Sullivan, Paula and Mathewson, Alan and Mason, Barry

Conference Title

Integrated Reliability Workshop Final Report, 1997 IEEE International

Title of Paper

Evolution of BSIM3v3 parameters during hot-carrier stress

Year

1997

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

110

End Page

118

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details