Mandatory Fields

Authors

Ciofi, C and Dattilo, V and Neri, B and Foley, S and Mathewson, A

Conference Title

Physical and Failure Analysis of Integrated Circuits, 1999. Proceedings of the 1999 7th International Symposium on the

Title of Paper

Long term noise measurements to characterize electromigration in metal lines of ICs

Year

1999

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

132

End Page

135

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details