Conference Publication Details

Mandatory Fields

Authors

Foley, Sean and Molyneaux, James and Mathewson, Alan

Conference Title

Microelectronic Manufacturing

Title of Paper

Fast wafer-level detection and control of interconnect reliability

Year

2000

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

166

End Page

177

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details