Mandatory Fields

Authors

Chen, Wenbin and McCarthy, Kevin G and Mathewson, Alan

Conference Title

Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on

Title of Paper

Practical Considerations for Measurements of Test Structures for Dielectric Characterization

Year

2009

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

221

End Page

225

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details