Mandatory Fields

Authors

Martin, A and O'Sullivan, P and Mathewson, A and Suehle, JS and Chaparala, P

Year

1997

Month

January

Journal

Solid-State Electronics

Title

Investigation of the influence of ramped voltage stress on intrinsic< i> t< sub> bd of MOS gate oxides

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

Issue

Start Page

1013

End Page

1020

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details