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Mandatory Fields

Authors

O'Sullivan, Paula and Mathewson, Alan

Year

1993

Month

January

Journal

Microelectronics Reliability

Title

Implications of a localised defect model for wafer level reliability measurements of thin dielectrics

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

33

Issue

11

Start Page

1679

End Page

1685

Abstract

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Editors

Publisher

ISBN / ISSN

Edition

URL

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