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Authors

Minehane, S and Healy, S and O'Sullivan, P and McCarthy, K and Mathewson, A and Mason, B

Year

1997

Month

January

Journal

Microelectronics Reliability

Title

Direct parameter extraction for hot-carrier reliability simulation

Status

Validated

Peer Reviewed

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Volume

37

Issue

10

Start Page

1437

End Page

1440

Abstract

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Edition

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