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Mandatory Fields

Authors

Foley, S and Molyneaux, J and Mathewson, A

Year

1999

Month

January

Journal

Microelectronics Reliability

Title

An evaluation of fast wafer level test methods for interconnect reliability control

Status

Validated

Peer Reviewed

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Keywords

Volume

39

Issue

11

Start Page

1707

End Page

1714

Abstract

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Publisher

ISBN / ISSN

Edition

URL

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