Mandatory Fields

Authors

Martin, Andreas and O'Sullivan, Paula and Mathewson, Alan

Year

1996

Month

January

Journal

Quality and reliability engineering international

Title

Investigation of reliability measurements with ramped and constant voltage stress on MOS gate oxides

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

Issue

Start Page

281

End Page

286

Abstract

Publisher Location

Editors

Publisher

ISBN / ISSN

Edition

URL

DOI Link

Grant Details

Funding Body

Grant Details