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Authors

Minehane, Secin and Meehan, Alan and O'Sullivan, Paula and Mathewson, Alan and Mason, Barry

Conference Title

Integrated Reliability Workshop, 1996., IEEE International

Title of Paper

The application of a direct parameter extraction strategy to hot-carrier reliability simulation of n-channel LDD MOSFETs

Year

1996

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

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