Mandatory Fields

Authors

Minehane, Sean and Healy, Sharon and O'Sullivan, Paula and McCarthy, Kevin and Mathewson, Alan and Mason, Barry

Conference Title

Physical \& Failure Analysis of Integrated Circuits, 1997., Proceedings of the 1997 6th International Symposium on

Title of Paper

Direct BSIM3v3 parameter extraction for hot-carrier reliability simulation of n-channel LDD MOSFETs

Year

1997

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

133

End Page

139

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details