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Mandatory Fields

Authors

Sheehan, E and Hurley, PK and Mathewson, A

Year

1998

Month

January

Journal

Microelectronics Reliability

Title

Hot carrier degradation mechanisms in sub-micron< i> p channel MOSFETs: Impact on low frequency (1/f) noise behaviour

Status

Validated

Peer Reviewed

Optional Fields

Keywords

Volume

38

Issue

6

Start Page

931

End Page

936

Abstract

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Editors

Publisher

ISBN / ISSN

Edition

URL

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