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Mandatory Fields
MacSweeney, Dermot and McCarthy, Kevin G and Floyd, Liam and Duane, Russell and Hurley, Paul and Power, James A and Kelly, Sean C and Mathewson, Alan
2003
January
Semiconductor Manufacturing, IEEE Transactions on
Improving the accuracy and efficiency of junction capacitance characterization: strategies for probing configuration and data set size
Validated
Optional Fields
16
2
207
214
Grant Details