Conference Publication Details

Mandatory Fields

Authors

Martin, A and O'Sullivan, P and Ribbrock, T and Mathewson, A

Conference Title

Integrated Reliability Workshop, 1996., IEEE International

Title of Paper

Injected charge as an indicator for at bd increase of pre-stressed gate oxides

Year

1996

Month

January

Status

Validated

Peer Reviewed

Times Cited

()

Optional Fields

Keywords

Editors

Start Page

142

End Page

152

Location

Start Date

End Date

Abstract

Funded By

URL

DOI Link

Grant Details

Funding Body

Grant Details