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Authors

Foley, Sean and Molyneaux, James and Mathewson, Alan

Year

2000

Month

January

Journal

Semiconductor Manufacturing, IEEE Transactions on

Title

An evaluation of test methods for the detection and control of interconnect reliability

Status

Validated

Peer Reviewed

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Keywords

Volume

13

Issue

2

Start Page

127

End Page

135

Abstract

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ISBN / ISSN

Edition

URL

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