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Authors

Hobbs, L and Mathewson, A and Lane, WA

Year

1988

Month

January

Journal

Electron Device Letters, IEEE

Title

Improved breakdown for SOI MOSFETs fabricated in electron-beam recrystallized polysilicon

Status

Validated

Peer Reviewed

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Keywords

Volume

9

Issue

8

Start Page

385

End Page

387

Abstract

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Publisher

ISBN / ISSN

Edition

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